![]() ![]() Photographic optics, photolithographic optics, contact lenses, display systems, AR/VR optics, and automototive lenses are just a few examples in the long list of such optical systems. Most optical systems are expected to perform to a predetermined level of image integrity. MTF is a direct and quantitative measure of image quality. This article serves to identify the reasons for specification and measurement of MTF as a system characterization tool. As the demand for higher quality, higher resolution optical systems became prevalent, both designers and metrology scientists began investigating MTF as a standardized method of optical system characterization. Modulation Transfer Function (MTF) has been associated with the measurement of the performance of optical systems since the initial introduction of linear system analysis to the field of optics. Optikos is the leader in the area of MTF measurement technologies and offers a full product line designed to meet virtually all measurement requirements. Various tests and test techniques are described in detail and in concept.įurther inquiries regarding test theory, general test techniques and application specifics should be directed to Optikos Corporation. While a guide of this size cannot begin to address all the intricacies and subtleties of testing, it is intended to provide a foundation for understanding, and to introduce the reader to the fundamentals of testing. This guide is designed to provide insight into the theory and practice of measuring the Modulation Transfer Function and related quantities. This has made what was once a tedious and involved process into virtually an instantaneous measurement. ![]() Over the past few decades technological advances, including the laser interferometer, high-speed imaging devices (CCD and CMOS Cameras), and advanced computer algorithms have revolutionized the measurement and calculation of MTF. ![]() A basic and useful parameter, especially for imaging systems, is the Modulation Transfer Function, or MTF. With the growing role played by optical devices in measurement, communication, and photonics, there is a clear need for characterizing optical components. ![]()
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